The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Jun. 24, 2004
Jean-marc Decitre, Saint-Etienne, FR;
Michel Lemistre, Livry-Gargan, FR;
Jamal Ben Youssef, Brest, FR;
Francois Lepoutre, Janvry, FR;
Dominique Placko, Creteil, FR;
Pierre-yves Joubert, Paris, FR;
Jean-Marc Decitre, Saint-Etienne, FR;
Michel Lemistre, Livry-Gargan, FR;
Jamal Ben Youssef, Brest, FR;
Francois Lepoutre, Janvry, FR;
Dominique Placko, Creteil, FR;
Pierre-Yves Joubert, Paris, FR;
Abstract
A quantitative magneto-optical imaging method is used to form an image of a target material. An active material is placed close to the target material and produces a Faraday rotation in a polarized light beam. The Faraday rotation of the active material is essentially proportional to the magnetization of the target material when this latter is subjected to an exciting magnetic field. Photodetector means detect the beam reflected after passing through the active material. The light from the reflected beam can then be analyzed for obtaining the amplitude and phase of an interfering magnetic field generated by a defect in the target material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile