The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Mar. 25, 2005
Applicant:

Mack Schermer, Belmont, MA (US);

Inventor:

Mack Schermer, Belmont, MA (US);

Assignee:

Perkinelmer LAS, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
Abstract

Detection apparatus for performing surface plasmon resonance (SPR) measurements on a sample includes a support having side walls and a bottom wall defining a plurality of adjacent wells. The bottom wall has integrated therein SPR detectors underlying the wells for detecting the refractive indexes of samples deposited in the wells. Each SPR detector includes a prism having an exterior entrance surface, an exterior exit facet and an interior sensing surface located at the bottom of the overlying well, and a thin metal layer coated on the sensing surface. The prism may be molded from a transparent polymer into the bottom of a standard-format microplate structure. That structure may be used in conjunction with an SPR measuring or reading instrument to perform label-less assay measurements on various samples in an efficient and reliable manner. A method of acquiring the assay measurements is also disclosed.


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