The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
May. 18, 2006
Pradeep Padukone, San Jose, CA (US);
Bin Liu, San Jose, CA (US);
Pradeep Padukone, San Jose, CA (US);
Bin Liu, San Jose, CA (US);
Maxtor Corporation, Longmont, CO (US);
Abstract
Methods of calibrating an analog front end (AFE) of a read/write channel include measuring a first magnitude of a test signal, measuring a second magnitude of an output signal of the AFE generated in response to the test signal, and comparing the first magnitude and the second magnitude to generate a measure of a gain of the AFE at a frequency of the test signal. A data storage device includes a read/write head configured to generate an analog input signal, an AFE coupled to the read/write head and configured to amplify and filter the analog input signal, a test signal generator configured to generate a test signal having a frequency substantially equal to a fundamental frequency of the analog input signal or any of its harmonics, and an attenuator coupled between the test signal generator and the AFE.