The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Sep. 30, 2005
Applicant:
Peter C. Metz, Macungie, PA (US);
Inventor:
Peter C. Metz, Macungie, PA (US);
Assignee:
Agere Systems Inc., Allentown, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and apparatus are provided for trimming a phase detector in a delay-locked-loop. A latch that evaluates a phase offset between two signals is trimmed by applying two signals to the latch that are substantially phase aligned; obtaining a phase offset between the two signals measured by the latch; and adjusting a trim setting of one or more buffers associated with the two signals until the phase offset satisfies one or more predefined criteria. The two signals can be a clock signal and an inverted version of the clock signal. The two signals can be a source of phase aligned data generated from a single clock source.