The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Mar. 31, 2005
Applicants:

Rene Abreu, New Fairfield, CT (US);

Jeffrey Grotts, Danbury, CT (US);

Alexander J. Majewski, Fairfield, CT (US);

Inventors:

Rene Abreu, New Fairfield, CT (US);

Jeffrey Grotts, Danbury, CT (US);

Alexander J. Majewski, Fairfield, CT (US);

Assignee:

Goodrich Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for processing signals includes a receiver assembly for receiving a signal. The signal has a sample component with a sample electric field and a sample polarization, and has a reference component with a reference electric field and a reference polarization. The receiver assembly includes an analyzer for polarimetrically processing the signal, including differencing the signal to generate a difference electric field proportional to the difference of the sample and reference electric fields. By polarimetrically differencing the signal, the analyzer reduces the magnitude of the common-mode signal at the difference signal receiver. The receiver assembly includes an electric-field detector for measuring the difference electric field such that the reduction in common-mode amplitude decreases the noise equivalent power of the electric-field detector. One advantage of the present invention, then, is the reduction of noise equivalent power of the electric-field detector when measuring small variations in large electric fields.


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