The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Jul. 05, 2005
Gianluigi Degeronimo, Syosset, NY (US);
Gianluigi DeGeronimo, Syosset, NY (US);
Brookhaven Science Associates, LLC, Upton, NY (US);
Abstract
A device and method for measuring a depth of interaction of an ionizing event and improving resolution of a co-planar grid sensor (CPG) are provided. A time-of-occurrence is measured using a comparator to time the leading edge of the event pulse from the non-collecting or collecting grid. A difference signal between the grid signals obtained with a differential amplifier includes a pulse with a leading edge occurring at the time-of-detection, measured with another comparator. A timing difference between comparator outputs corresponds to the depth of interaction, calculated using a processor, which in turn weights the difference grid signal to improve spectral resolution of a CPG sensor. The device, which includes channels for grid inputs, may be integrated into an Application Specific Integrated Circuit. The combination of the device and sensor is included. An improved high-resolution CPG is provided, e.g., a gamma-ray Cadmium Zinc Telluride CPG sensor operating at room temperature.