The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Oct. 19, 2004
Ralf Engelmann, Jena, DE;
Joerg-michael Funk, Jena, DE;
Joerg Steinert, Jena, DE;
Bernhard Zimmermann, Jena, DE;
Stefan Wilhelm, Jena, DE;
Joerg Engel, Weida, DE;
Ulrich Meisel, Jena, DE;
Ralf Engelmann, Jena, DE;
Joerg-Michael Funk, Jena, DE;
Joerg Steinert, Jena, DE;
Bernhard Zimmermann, Jena, DE;
Stefan Wilhelm, Jena, DE;
Joerg Engel, Weida, DE;
Ulrich Meisel, Jena, DE;
Carl Zeiss Jena GmbH, Jena, DE;
Abstract
Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.