The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7270478 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 18, 2007

Filed:

May. 09, 2005
Applicant:

Miguel Angel Jimarez, Gilbert, AZ (US);

Inventor:

Miguel Angel Jimarez, Gilbert, AZ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of using x-rays to align screen printing of flip chip using x-ray sub-assembly in a chip fabricating assembly. X-rays are directed onto a substrate having receptor pads and a printing screen having fine apertures. The substrate is aligned with the printing screen based on the detection and analysis of the real-time image generated from the x-rays passing through the substrate and printing screen. The x-ray alignment system is capable of aligning gold plated receptor pads of five microns or less and disposed upon a low light contrast ceramic (e.g., 9011 alumina) substrate with a screen printing stencil having very small apertures of less than 125 microns.


Find Patent Forward Citations

Jimarez, Miguel. (2007). X-ray alignment system for fabricating electronic chips (U.S. Patent No. 7270478). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7270478

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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