The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Jun. 13, 2005
Applicants:

Mark Gregory, Lafayette, IN (US);

Dennis Barket, West Lafayette, IN (US);

John W Grossenbacher, West Lafayette, IN (US);

Anthony Cochran, West Lafayette, IN (US);

Inventors:

Mark Gregory, Lafayette, IN (US);

Dennis Barket, West Lafayette, IN (US);

John W Grossenbacher, West Lafayette, IN (US);

Anthony Cochran, West Lafayette, IN (US);

Assignee:

Griffin Analytical Technologies, LLC, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/20 (2006.01); F16K 11/072 (2006.01);
U.S. Cl.
CPC ...
Abstract

The disclosure relates to instrument assemblies that can include a sample introduction port coupled to a chamber configured to receive the sample from the sample introduction port and provide analysis of the sample with a valve between the sample introduction port and the chamber. The instrument assemblies can include a septum housing assembly coupled to an analysis chamber interface with the interface including a valve and a cam rotatably mounted to the septum housing assembly and/or coupled to the valve. Analysis methods are also provided that can include introducing a sample to an instrument through both a sample introduction port and a valve coupled to the sample introduction port, and, after introducing the sample, closing the valve to seal the sample introduction port from a remainder of the instrument, with the remainder of the instrument being configured to analyze the sample after the introducing through the sample introduction port.


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