The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Apr. 30, 2003
Applicants:

Mark P. Barry, Sydney, AU;

Yi-chen J. LI, Sydney, AU;

Oliver J. Ridler, Thornleigh, AU;

Inventors:

Mark P. Barry, Sydney, AU;

Yi-Chen J. Li, Sydney, AU;

Oliver J. Ridler, Thornleigh, AU;

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/23 (2006.01); H03M 13/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

In the method of rate-matching, software is used to calculate at least one rate-matching parameter for data, and dedicated hardware is used to perform at least one of a puncturing and repetition process on data based on the calculated rate-matching parameter. In rate de-matching, software is again used to calculate at least one rate de-matching parameter for received data, and dedicated hardware is used to compensate for puncturing and repetition based on the calculated rate de-matching parameter.


Find Patent Forward Citations

Barry, Mark. (2007). Method and apparatus for dedicated hardware and software split implementation of rate matching and de-matching (U.S. Patent No. 7269783). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7269783

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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