The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Feb. 23, 2004
Applicants:

Jun LI, San Jose, CA (US);

Joseph Tzou, Mountain View, CA (US);

Thinh Tran, Palo Alto, CA (US);

Inventors:

Jun Li, San Jose, CA (US);

Joseph Tzou, Mountain View, CA (US);

Thinh Tran, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit device () can include a main portion () and a built-in self-test (BIST) portion () having outputs coupled to physical input structures (e.g., bond pads) () of the integrated circuit device (). A BIST portion () can test timing critical parameters that take into account the effect of input structures (). A BIST portion () can apply BIST test signals with a pipeline structure that can emulate timing parameters, such as a set-up time (Ts) and a clock-to-output time (Tco).


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