The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Mar. 26, 2003
Applicants:

Imre Kiss, Tampere, FI;

Marcel Vasilache, Tampere, FI;

Inventors:

Imre Kiss, Tampere, FI;

Marcel Vasilache, Tampere, FI;

Assignee:

Nokia Corporation, Espoo, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Pattern recognition, wherein a sequence of feature vectors is formed from a digitized incoming signal, the feature vectors comprising feature vector components, and at least one feature vector is compared with templates of candidate patterns by computing a distortion measure. A control signal based on at least one time-dependent variable of the recognition process is formulated, and the distortion measure is computed using only a subset of the vector components of the feature vector, the subset being chosen in accordance with said control signal. This reduces the computational complexity of the computation, as the dimensionality of the vectors involved in the computation is effectively reduced. Although such a dimension reduction decreases the computational need, it has been found not to significantly impair the classification performance.


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