The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Jun. 17, 2003
Shin Anei, Takarazuka, JP;
Shin Anei, Takarazuka, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
A method is provided that can conduct accurate correspondence of images in measuring an object based on images obtained by plural cameras so that measurement of the object is conducted precisely. The method includes the steps of capturing plural images by plural cameras, using an image in a photographing area common to the images, ex. image information obtained from an area that is set as a specific area to set camera parameters, using the set camera parameters to photograph the same photographing areas as those when the camera parameters are set so as to capture images anew, the photographing being performed by the plural cameras, determining corresponding points in the newly captured images, and obtaining three-dimensional information of the object included in a photographing area.