The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Jun. 07, 2006
Manfred Matthae, Jena, DE;
Werner Kleinschmidt, Adelebsen, DE;
Georg Herbst, Goettingen, DE;
Carl Zeiss Microimaging GmbH, Jena, DE;
Abstract
A microscope objective with high aperture, large object field and apochromatic correction in the wavelength range from ultraviolet to infrared. The microscope objective includes, starting from the object level: a first group of lenses with overall positive refraction power, including a cemented group with positive-negative refraction power effect, made out of one of two lenses, and of a further lens with positive refraction power, a second group of lenses with positive refraction power, including three cemented lenses, a third group of lenses with negative refraction power, including three cemented lenses, in which the side that faces the image plane is convex, a fourth group of lenses, consisting of a lens with positive refraction power and a cemented group of two lenses with positive-negative refraction power, and a fifth group of lenses, including two lenses in a cemented group with negative-positive refraction power.