The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Aug. 12, 2004
Applicants:

Lawrence B. Brown, Cochranville, PA (US);

Rudiger Kubitzek, Geilenkirchen, DE;

Alan Ingleson, Newbury, GB;

Joseph Reed, Carversville, PA (US);

Inventors:

Lawrence B. Brown, Cochranville, PA (US);

Rudiger Kubitzek, Geilenkirchen, DE;

Alan Ingleson, Newbury, GB;

Joseph Reed, Carversville, PA (US);

Assignee:

Datacolor Holding AG, Lucerne, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring head of the present invention conveys light from an external source through at least one optical fiber to at least one respective plane mirror inside the measuring head, where the light reflects through and is collimated by at least one collimating lens so as to be incident on a sample, in one embodiment, at an angle of substantially 45 degrees. The resulting optical path is folded once and thereby allows enough virtual space to redirect the light without excessive bending of the fibers. Light diffused from the sample is, in one embodiment, perpendicularly collected by a focusing lens, focused on the end of another optical fiber and directed outside of the measuring head to be used, for example, by a measuring instrument for the spectral analysis of the collected light.


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