The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Oct. 29, 2004
Applicants:

Peter Kiesel, Palo Alto, CA (US);

Oliver H. Wolst, Walzbachtal, DE;

Michael A. Kneissl, Mountain View, CA (US);

H Ben Hsieh, Mountain View, CA (US);

Inventors:

Peter Kiesel, Palo Alto, CA (US);

Oliver H. Wolst, Walzbachtal, DE;

Michael A. Kneissl, Mountain View, CA (US);

H Ben Hsieh, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/30 (2006.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved method of analyzing target analytes in a sample is described. The method is based on anti-resonant guided optical waveguides which enables a strongly improved light-target interaction since the light can be guided within the target-containing medium. The light-target interaction can be monitored by many different means to determine characteristics of the target analyte. The anti-resonant waveguide concept is suitable for a large variety of characterization methods and combinations of them, since it is relatively unaffected by changes to both wavelength and film thickness.


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