The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Aug. 25, 2000
Applicants:

Norihiko Murata, Kanagawa, JP;

Takashi Kitaguchi, Kanagawa, JP;

Shin Aoki, Kanagawa, JP;

Inventors:

Norihiko Murata, Kanagawa, JP;

Takashi Kitaguchi, Kanagawa, JP;

Shin Aoki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/262 (2006.01); H04N 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In image processing method and apparatus of the present invention, an image distortion caused by an oblique image pickup is corrected. A plurality of images of an object on an object plane are input, the plurality of images including at least a pair of partially overlapping first and second images that are taken at two viewpoints, the first and second images sharing a common location on the object plane. A feature point of the first image corresponding to the common location and a matched point of the second image corresponding to the feature point of the first image are determined. A direction of the object plane is calculated based on the feature point and the matched point. A distortion-corrected image on a projection plane, which is parallel to the object plane, is generated by projecting one of the first and second images onto the projection plane based on the direction of the object plane through a perspective projection.


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