The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Feb. 16, 2005
Frederick C. Wellstood, Fairfax, VA (US);
Su-young Lee, Berlin, DE;
John Matthews, Greenbelt, MD (US);
Frederick C. Wellstood, Fairfax, VA (US);
Su-Young Lee, Berlin, DE;
John Matthews, Greenbelt, MD (US);
United States of America as represented by the Secretary of the Air Force, Washington, DC (US);
Abstract
A scanning SQUID microscope is set forth to provide improved output imaging. The SQUID microscope includes a vertically adjustable housing adapted to securely retain a SQUID loop or sensor. A scanning stage of the SQUID microscope is adapted to support a sample while moving the sample along a predetermined path to selectively position predetermined portions of the sample in close proximity to the SQUID loop or sensor to permit the loop or sensor to detect predetermined magnetic field information provided by the predetermined portions of the sample. A position control processor coupled to the scanning stage is operative to receive and process the predetermined magnetic field information to provide corresponding position noise information. Criteria are also presented for determining the expected level of position noise under given experimental conditions.