The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Jun. 06, 2006
Kunihiko Sasaki, Hino, JP;
Yasunari Matsukawa, Asaka, JP;
Hiroshi Sasaki, Tokyo, JP;
Tatsuo Nakata, Hino, JP;
Kunihiko Sasaki, Hino, JP;
Yasunari Matsukawa, Asaka, JP;
Hiroshi Sasaki, Tokyo, JP;
Tatsuo Nakata, Hino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A scanning laser microscope that can quantitatively display a laser irradiation power on a display unit and that can suppress fluctuations in the laser irradiation power is provided. The scanning laser microscope includes a light source configured to emit laser light, a scanning unit configured to scan the laser light emitted from the light source on a sample, a photodetector configured to detect light from the sample, a processing unit configured to convert a signal from the photodetector into an image signal of the sample and to output the image signal, a reference light detector configured to detect part of the laser light emitted from the light source as a reference light signal, a laser light control unit configured to control the power of the laser light emitted from the light source, an irradiation-power calculation unit configured to calculate an irradiation power value at the sample on the basis of the reference light signal detected by the reference light detector, and a display unit configured to display the calculated irradiation power value at the sample.