The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Jan. 17, 2002
Applicants:

Patrick Ziegler, Boeblinen, DE;

Ralf Stolte, Hamburg, DE;

Peter Thoma, Rottenburg, DE;

Inventors:

Patrick Ziegler, Boeblinen, DE;

Ralf Stolte, Hamburg, DE;

Peter Thoma, Rottenburg, DE;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/01 (2006.01); H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a measurement setup for determination of optical properties of a device under test in both directions in transmission and in reflection, includes a coding device distinguishably coding at least two parts of a provided measurement signal, feeding elements feeding the at least two parts into the DUT from both directions, receiving elements receiving the signals from both directions transmitted and reflected by the DUT, identifying at least the coded parts in the signals transmitted and reflected by the DUT, and analyzing at least the identified parts to determine at least one optical property of the DUT from both directions in transmission and in reflection.


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