The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Sep. 21, 2006
Hisao Hiramatsu, Kyoto, JP;
Hironobu Oota, Kyoto, JP;
Hisao Hiramatsu, Kyoto, JP;
Hironobu Oota, Kyoto, JP;
Arkray, Inc., Kyoto, JP;
Abstract
A measurement instrument for adequately correcting data in consideration of the deterioration of a reagent used for measurement over time. A deterioration correction data table where the variation of the sensitivity of each reagent from the date of manufacture of the reagent to the expiration date is recorded for each lot is stored in a deterioration correction data storage unit (). A bar code including information designating the lot and the date of manufacture is attached to the reagent. A CPU () designates the deterioration correction data table corresponding to the lot of the reagent used for measurement according to the reagent information read by the bar code reader of a nozzle derive unit (), calculates the reagent sensitivity by interpolation on the measurement data with reference to the designated deterioration data table, and corrects the measurement data with respect to the deterioration of the reagent according to the calculated reagent sensitivity.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile