The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Aug. 31, 2005
Applicants:
David E. Wilcox, Gilbert, AZ (US);
Timothy R. Duffy, Chandler, AZ (US);
Inventors:
David E. Wilcox, Gilbert, AZ (US);
Timothy R. Duffy, Chandler, AZ (US);
Assignee:
Honeywell International, Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01); G01M 17/00 (2006.01); G01N 29/265 (2006.01); G01N 27/87 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inspection device for performing nondestructive testing on a test subject includes a manually controlled inspection cart. The inspection device also includes a nondestructive testing platform and a computer coupled to the inspection cart. The computer is operable to control the movement of the nondestructive testing device when the inspection device is within a predetermined distance from the test subject.