The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Mar. 03, 2006
Jiri Gardavsky, Heroldsberg, DE;
Jim Roan, Ann Arbor, MI (US);
Yu Guo, Canton, MI (US);
Hannes Loferer, Ann Arbor, MI (US);
Richard A. Krakowski, Troy, MI (US);
Jiri Gardavsky, Heroldsberg, DE;
Jim Roan, Ann Arbor, MI (US);
Yu Guo, Canton, MI (US);
Hannes Loferer, Ann Arbor, MI (US);
Richard A. Krakowski, Troy, MI (US);
Perceptron, Inc., Plymouth, MI (US);
Abstract
A system and method for identifying significant bivariate checkpoints. The system includes a controller configured to receive measurements for a plurality of checkpoints and calculate the covariance and correlation for each checkpoint pair. The controller identifies significant bivariate checkpoints based on the covariance between the checkpoint pairs. Further, the controller may also calculate the correlation for each checkpoint pair and identify the significant bivariate checkpoints based on a combination of the covariance and the correlation between the checkpoints. Further, the controller may rank the significant bivariate checkpoints and provide the significant bivariate checkpoints to a principal component algorithm.