The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2007

Filed:

Jun. 25, 2001
Applicants:

Heng-yu Jian, Los Angeles, CA (US);

Lennart Mathe, San Diego, CA (US);

Inventors:

Heng-Yu Jian, Los Angeles, CA (US);

Lennart Mathe, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for reducing the peak to average ratio of signals, so that the signals can be amplified more efficiently. An error signal that corresponds to crests of the input signal is generated, and subtracted from the input signal. When a crest is so long that it corresponds to more than one sample, only the maximum sample contained in the crest is used to form the error signal. Optionally, multiple stages of decresting may be implemented sequentially.


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