The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Sep. 29, 2004
Herbert Haunstein, Bavaria, DE;
Ralph Schlenk, Bavaria, DE;
Herbert Haunstein, Bavaria, DE;
Ralph Schlenk, Bavaria, DE;
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
The delay setting of an optical delay line interferometer (DLI) used to decode differentially encoded phase shift keyed signals (DPSK or DQPSK) is controlled using a control signal representative of the ratio P/Pof the rate of occurrence of double errors and the rate of occurrence of errors. The ratio P/P, as the delay setting of the DLI is varied, exhibits a characteristic W-shaped structure consisting of a local maximum at the optimum value and two minima adjacent to the maximum, one on each side of it. This structure is present over a wide range of signal to noise ratio and residual dispersion.