The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Sep. 02, 2003
Chih-kuang Chang, Tu-chen, TW;
LI Jiang, Shenzhen, CN;
Chih-Kuang Chang, Tu-chen, TW;
Li Jiang, Shenzhen, CN;
Hong Fu Jin Precision Ind.(Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Ind. Co., Ltd., Tu-Cheng, TW;
Abstract
An image measurement system and method for obtaining measurement data on objects by processing images of the objects is provided. The image measurement system includes an image obtaining device () for obtaining a first image of an object to be measured and a second image of a standard object, and a plurality of measurement computers () linked to the image obtaining device via a communication network (). The measurement computers are used for processing the first image and the second image to obtain measurement data on the object. Each of the measurement computers comprises an image obtaining module (), an image processing module (), and an image measuring module ().