The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2007

Filed:

Jan. 16, 2002
Applicants:

Wai William Wang, Taoyuan, TW;

Meng-shin Yen, Taipei, TW;

Tso-tsai Chen, Taipei, TW;

Inventors:

Wai William Wang, Taoyuan, TW;

Meng-Shin Yen, Taipei, TW;

Tso-Tsai Chen, Taipei, TW;

Assignee:

BenQ Corporation, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is used for calibrating a writing power of an optical storage carrier player. The player has an access device for writing data onto the optical storage carrier. The carrier includes a center, an inner power calibration area (first calibration area), a data storage area, and an outer power calibration area (second calibration area). The method determines a writing location of the data in the data storage area, and controls the access device to perform an optical power calibration process in either the inner power calibration area or the outer power calibration area according to the writing location. Once completed, the method then utilizes a result of the optical power calibration process to determine a required writing power, and finally controls the access device to write the data to the optical storage carrier in the writing location with the required writing power.


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