The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2007

Filed:

Jun. 04, 2004
Applicant:

Jack Thiesen, Easley, MI (US);

Inventor:

Jack Thiesen, Easley, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an apparatus and methodology for insuring measurement accuracy and performance reliability in the operation of devices employed to interrogate SAW devices. The present subject matter relates to an arrangement and methodology that provides an interrogator paired together with a separate receiver, which may comprise a second interrogator, functioning together to perform a self-testing operation. The interrogator may be a handheld device that is temporarily paired with a separate receiver or a like device or the interrogator may correspond to more or less permanently paired set of devices physically placed in an array.


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