The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7263880 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 04, 2007

Filed:

May. 09, 2003
Applicants:

Julian Pop, Houston, TX (US);

Jean-marc Follini, Houston, TX (US);

Jean-michel Hache, Houston, TX (US);

Inventors:

Julian Pop, Houston, TX (US);

Jean-Marc Follini, Houston, TX (US);

Jean-Michel Hache, Houston, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for determining at least one downhole formation property is disclosed. The apparatus includes a pretest piston positionable in fluid communication with the formation, and a series of flowlines pressure gauges, and valves configured to selectively draw into the apparatus for measurement of one of formation fluid and mud. The method includes performing a first pretest to determine an estimated formation parameter; using the first pretest to design a second pretest and generate refined formation parameters whereby formation properties may be estimated.


Find Patent Forward Citations

Pop, Julian. (2007). Method for measuring formation properties with a time-limited formation test (U.S. Patent No. 7263880). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7263880

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…