The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2007

Filed:

Aug. 24, 2005
Applicants:

Cesar Avitia, Chihuahua, MX;

Martin Joel Ibarra, Chihuahua, MX;

Raul Antonio Rascon, Chihuahua, MX;

Inventors:

Cesar Avitia, Chihuahua, MX;

Martin Joel Ibarra, Chihuahua, MX;

Raul Antonio Rascon, Chihuahua, MX;

Assignee:

Visteon Global Technologies, Inc., Van Buren Township, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01D 11/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The instrument panel gauge assembly includes an applique having gauge graphics printed thereon and a needle pointer for a gauge assembly positioned adjacent thereto. A transparent chaplet is formed within the applique to allow light to pass through. The needle passes over the chaplet as the needle moves. When the needle is positioned directly in front of the chaplet, light is blocked from passing through the chaplet. A light sensing element is positioned behind the applique to detect the presence of light passing through the chaplet. A light baffle guides light passing through the chaplet to the light sensing element. A controller receives a signal from the light sensing element indicating when the needle pointer is directly in front of the chaplet. The controller then compares the actual input to the gauge with the position of the needle pointer, calculates a correction factor, and calibrates the gauge accordingly.


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