The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Sep. 30, 2003
James Chris Sackellares, Gainesville, FL (US);
Leonidas D. Iasemidis, Scottsdale, AZ (US);
Deng-shan Shiau, Gainesville, FL (US);
Linda Dance, Gainesville, FL (US);
Panos M. Pardalos, Gainesville, FL (US);
Wanpracha A. Chaovalitwongse, Hillsborough, NJ (US);
James Chris Sackellares, Gainesville, FL (US);
Leonidas D. Iasemidis, Scottsdale, AZ (US);
Deng-Shan Shiau, Gainesville, FL (US);
Linda Dance, Gainesville, FL (US);
Panos M. Pardalos, Gainesville, FL (US);
Wanpracha A. Chaovalitwongse, Hillsborough, NJ (US);
University of Florida Research Foundation Inc., Gainesville, FL (US);
Arizona Board of Regents, Tempe, AZ (US);
Abstract
Characterizing the behavior of a chaotic, multi-dimensional system is achieved by measuring each of a number of signals associated with the system, and generating therefrom, a spatio-temporal response based on each signal. Multiple dynamical profiles are then generated for each spatio-temporal response, where each of the multiple dynamical profiles correspond to a different one of multiple dynamical parameters. Over a period of time, a determination is made as to whether a certain level of dynamic entrainment and/or disentrainment exists between the dynamical profiles associated with a selected one or a selected combination of dynamical parameters. Seizure warnings and/or predictions are provided based on this determination.