The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Mar. 11, 2003
Noboru Kawaike, Kyoto, JP;
Ryuichiro Takaichi, Kyoto, JP;
Yorihisa Ikenaga, Kyoto, JP;
Toyoo Iida, Kyoto, JP;
Noboru Kawaike, Kyoto, JP;
Ryuichiro Takaichi, Kyoto, JP;
Yorihisa Ikenaga, Kyoto, JP;
Toyoo Iida, Kyoto, JP;
Omron Corporation, Kyoto-shi, JP;
Abstract
To provide a three-dimensional monitoring apparatus capable of detecting with high accuracy an incoming of an object into a predetermined three-dimensional space by using pattern light as a detecting carrier. A three-dimensional monitoring apparatus comprising (1) an irradiating device for irradiating predetermined pattern light to three-dimensional space S to be monitored, (2) an imaging device for imaging a projection pattern projected by irradiating of the pattern light on an incoming object M and on a screenin the space S to capture image data and (3) a measuring device to measure a position of the object M based on the comparison between a monitoring image captured by the imaging device when there is the object M in the space S and a reference image captured by the imaging device when there is no object M in the space S.