The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2007

Filed:

Feb. 03, 2004
Applicants:

Jens-peter Schlomka, Hamburg, DE;

Jörg Sabczynski, Norderstedt, DE;

Jörn Borgert, Hamburg, DE;

Inventors:

Jens-Peter Schlomka, Hamburg, DE;

Jörg Sabczynski, Norderstedt, DE;

Jörn Borgert, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

In the field of airport baggage inspection, a multi-level screening procedure is used. When a first level screening system () detects a 'suspicious region' inside a bag, it is transferred to a next level system () where the bag gets rescanned. According to the present invention, a device/method is provided for finding and tracking the suspicious region inside the baggage which allows to reduce the area to be rescanned significantly. For this purpose, the image from the first level system together with the position of the suspicious region within the image is transferred from the first level system to the second level system. On arrival of the bag at the second level (), a simple X-ray transmission image is measured using an additional source/detector system (). The two images are then rigidly registered in order to exactly determine the suspicious region in the second level scanner system.


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