The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7263050 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 28, 2007

Filed:

Dec. 16, 2005
Applicants:

Pi-hai Liu, Taipei, TW;

Yuh Cheng, Ju-Bei, TW;

Chih-ching Yu, Tao-Yuan Hsien, TW;

Chih-hsiung Chu, Taipei Hsien, TW;

Inventors:

Pi-Hai Liu, Taipei, TW;

Yuh Cheng, Ju-Bei, TW;

Chih-Ching Yu, Tao-Yuan Hsien, TW;

Chih-Hsiung Chu, Taipei Hsien, TW;

Assignee:

Mediatek Inc., Science-Based Industrial Park, Hsin-Chu Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, for tuning a plurality of write strategy parameters of an optical storage device, includes: a run-length limited (RLL) meter for detecting a plurality of lengths, each length corresponding to a pit or a land on an optical storage medium accessed by the optical storage device; and a calculation module coupled to the RLL meter for performing calculations according to the lengths to generate a plurality of calculation results; wherein the write strategy parameters are tuned according to the calculation results.


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