The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Jul. 15, 2004
Applicant:
Wolfgang Rentzsch, Wetzlar, DE;
Inventor:
Wolfgang Rentzsch, Wetzlar, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope includes an eyepiece, an illumination beam path for illuminating a specimen, and a detection beam path for imaging the specimen. A microscope operator interface is also provided, as well as an image overlay device for overlaying an image of the microscope operator interface onto the detection beam path so that the image of the microscope operator interface together with an image of the specimen is presented at the eyepiece. Also provided is at least one operating apparatus for interacting between the operator and the microscope operator interface.