The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2007

Filed:

Feb. 17, 2003
Applicants:

Shinji Uchida, Neyagawa, JP;

Kiyoko Oshima, Shijonawate, JP;

Masahiko Shioi, Katano, JP;

Inventors:

Shinji Uchida, Neyagawa, JP;

Kiyoko Oshima, Shijonawate, JP;

Masahiko Shioi, Katano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to solve the problem of a prior art biological attribute measuring device, i.e., measurement data is apt to vary because of unstable contact due to difficulty in controlling a thickness of a saliva layer and pain caused during the measurement, is provided a biological attribute measuring device including a contact device having a portion, at least part of which is a curved surface, for abutting against a measuring region to apply light to the measuring region, a light detecting means for detecting at least one selected from the group consisting of transmitted light, reflected light, scattered light and transmitted/reflected light from the measuring region and a measuring means for measuring a specific component in the measuring region based on the detection result.


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