The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Dec. 23, 2003
Kazuro Kageyama, Ushiku, JP;
Isamu Ohsawa, Kumagaya, JP;
Makoto Kanai, Tokyo, JP;
Yukiya Tsuchida, Niigata, JP;
Keiichi Nagata, Tokyo, JP;
Kazuro Kageyama, Ushiku, JP;
Isamu Ohsawa, Kumagaya, JP;
Makoto Kanai, Tokyo, JP;
Yukiya Tsuchida, Niigata, JP;
Keiichi Nagata, Tokyo, JP;
Toudai Tlo, Inc., Tokyo, JP;
Abstract
This invention provides a device or method for measuring vibration with high sensitivity and over a wide bandwidth. A curved section is formed in an optical fiber. The curved section is disposed on a place to be measured. Light is input in the optical fiber, and then variation of frequency between the input light and the output light is detected. Infinitesimal vibration applied to the curved section can be measured as variation of frequency between the input light and the output light. Further, it is possible to measure vibration over a wide bandwidth.