The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2007

Filed:

May. 25, 2004
Applicants:

David L. Weldum, Jamesville, NY (US);

Clark A. Bendall, Syracuse, NY (US);

Michael C. Lesmerises, Liverpool, NY (US);

Thomas W. Karpen, Skaneateles, NY (US);

Jon R. Salvati, Skaneateles, NY (US);

Inventors:

David L. Weldum, Jamesville, NY (US);

Clark A. Bendall, Syracuse, NY (US);

Michael C. Lesmerises, Liverpool, NY (US);

Thomas W. Karpen, Skaneateles, NY (US);

Jon R. Salvati, Skaneateles, NY (US);

Assignee:

GE Inspection Technologies LP, Lewiston, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for storing, within an image transfer medium, an image and image-specific data associated with the image includes obtaining the image-specific data from a probe such as a borescope or endoscope, obtaining the corresponding image, choosing a specific image transfer medium, writing the image to the medium, and writing the image-specific data to a marker in the medium. In this manner, storing a combination of image data and one or more of system calibration data, overlay replacement data, and audio comment data in a single file of either a non-standard file format or a standard file format that does not explicitly support the inclusion of these data types is possible.


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