The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7261856 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 28, 2007

Filed:

Sep. 09, 2003
Applicant:

Sinn-wen Chen, Hsinchu, TW;

Inventor:

Sinn-Wen Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention takes advantage of the characteristics that the effective charge numbers of different metals have different values and even with different signs, and alloys are prepared with the metals of different signs of effective charge numbers. The effective charge numbers of the alloys are the summation of the mole fraction of each constituent metal times its respective effective charge number. Based on the knowledge of the calculated effective charge number, alloys are prepared with proper selection of constituent metals and proper ratios. When the alloy is under the influence of an electric field, the atoms, with the tendency to move in the same direction of the electron flow, interact with the atoms, with the tendency to move in the opposite. The alloys are thus electromigration effect-free or electromigration effect-insignificant.


Find Patent Forward Citations

Chen, Sinn-Wen. (2007). Electromigration effect-insignificant alloys and the alloys' designing method (U.S. Patent No. 7261856). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7261856

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