The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Nov. 10, 2003
Hans Torp, Trondheim, NO;
Bjorn Olstad, Stathelle, NO;
Andreas Heimdal, Trondheim, NO;
Steinar Bjaerum, Trondheim, NO;
Hans Torp, Trondheim, NO;
Bjorn Olstad, Stathelle, NO;
Andreas Heimdal, Trondheim, NO;
Steinar Bjaerum, Trondheim, NO;
G.E. Vingmed Ultrasound AS, , NO;
Abstract
An ultrasound system and method for calculation and display of tissue deformation parameters are disclosed. The tissue deformation parameter strain is determined by an accumulation of strain rate estimates for consecutive frames over an interval. The interval may be a triggered interval generated by, for example, an R-wave in an ECG trace. Three quantitative tissue deformation parameters, such as tissue velocity, tissue velocity integrals, strain rate and/or strain, may be presented as functions of time and/or spatial position for applications such as stress echo. For example, strain rate or strain values for three different stress levels may be plotted together with respect to time over a cardiac cycle. Parameters which are derived from strain rate or strain velocity, such as peak systolic wall thickening percentage, may be plotted with respect to various stress levels.