The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Feb. 13, 2006
Kouji Nishio, Itabashi-ku, JP;
Gaku Takeuchi, Itabashi-ku, JP;
Masahiro Shibutani, Itabashi-ku, JP;
Katsuhiko Kobayashi, Itabashi-ku, JP;
Kouji Nishio, Itabashi-ku, JP;
Gaku Takeuchi, Itabashi-ku, JP;
Masahiro Shibutani, Itabashi-ku, JP;
Katsuhiko Kobayashi, Itabashi-ku, JP;
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
An eye's optical characteristics measuring system, comprising a target projecting means for projecting a target image on a fundus of an eye under test, a photodetecting means for guiding the target image toward a photoelectric detector, a pupil diameter measuring means, a calculating means for calculating optical characteristics of the eye under test according to distribution of optical intensity obtained based on an image acquired by the photoelectric detector, and an aperture selecting means provided on each of the target projecting means and the photodetecting means, wherein the aperture selecting means is independently driven, and apertures to restrict a projecting luminous flux and a photodetecting luminous flux are selected based on a pupil diameter of the eye under test measured by the pupil diameter measuring means.