The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Sep. 30, 2004
Ghasi R. Agrawal, Sunnyvale, CA (US);
Willie K. Chan, Milpitas, CA (US);
Ghasi R. Agrawal, Sunnyvale, CA (US);
Willie K. Chan, Milpitas, CA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method for allowing native, functional, and test configurations of a memory to be independent of one another includes steps as follows. A memory is first provided. The memory has a native configuration including k words and n data output pins, k and n being positive integers. Each of the k words has a width of n bits. Then the n data output pins are connected to a programmable multiplexer for multiplexing the n data output pins into at least one group of data output pins of the programmable multiplexer. Each of the at least one group of data output pins has no more than n data output pins and is suitable for enabling the memory to have at least one of a test configuration or a functional configuration. At user's discretion, the test configuration may or may not have a width of n bits, the functional configuration may or may not have a width of n bits, and the test configuration and the functional configuration may or may not have the same width.