The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2007

Filed:

Nov. 06, 2002
Applicant:

David Llewellyn Rees, Berkshire, GB;

Inventor:

David Llewellyn Rees, Berkshire, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A model generation unit () is provided. The model generation unit includes an alignment module () arranged to receive pairs of sequences of parameter frame vectors from a buffer () and to perform dynamic time warping of the parameter frame vectors to align corresponding parts of the pair of utterances. A consistency checking module () is provided to determine whether the aligned parameter frame vectors correspond to the same word. If this is the case the aligned parameter frame vectors are passed to a clustering module () which groups the parameter frame vectors into a number of clusters. Whilst clustering the parameter frame vectors, the clustering module () determines for each grouping an objective function calculating the best fit of a model to the clusters per degrees of freedom of that model. When the best fit per degrees of freedom is determined, the parameter frame vectors are passed to a hidden Markov model generator () which generates a hidden Markov model having states corresponding to the clusters determined to have the best fit per degrees of freedom.


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