The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Jan. 03, 2006
Keith B. Stobie, Bellevue, WA (US);
Sujay Sahni, Sammamish, WA (US);
Keith B. Stobie, Bellevue, WA (US);
Sujay Sahni, Sammamish, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A testing technique and apparatus are described for apply a test to a System Under Test (SUT) in one or more configurations of the SUT. The test can generate and store multiple output results that capture the behavior of the SUT in performing the test. Policy analysis logic applies a policy to the output results to generate an output verdict that reaches some conclusion regarding the outcome of the test. That is, the applied policy maps a subset of stored output results (and possibly input parameters) into the output verdict based on specified rules. A tester can apply different policies to investigate different aspects of the SUT's behavior.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile