The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
May. 07, 2004
Raulf M. Polichar, San Diego, CA (US);
Gary M. Rush, San Diego, CA (US);
Scott T. Smith, San Diego, CA (US);
Raulf M. Polichar, San Diego, CA (US);
Gary M. Rush, San Diego, CA (US);
Scott T. Smith, San Diego, CA (US);
Science Applications International Corporation, San Diego, CA (US);
Abstract
Digital pixel data is obtained from radiographic imaging of one or more objects, and corresponds to an imaged area containing a feature to be measured. A data profile for a region around the measured feature is created from the digital pixel data. A reference profile is then created from the data profile. The reference profile represents an expected data profile for a reference condition of the objects, and accounts for the point spread function of the imager. The difference between the data profile and the reference profile is calculated. Based on that difference, the degree by which the actual condition of the objects varies from the reference condition is determined. The calculated difference can be compared to a lookup table mapping previously calculated differences to degrees of variation from the reference condition. The calculated difference can also be used as an input to an experimentally derived formula.