The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Sep. 18, 2003
Masaki Shikami, Ibaraki, JP;
Hirofumi Torita, Ibaraki, JP;
Masaki Shikami, Ibaraki, JP;
Hirofumi Torita, Ibaraki, JP;
Nitto Denko Corporation, Osaka, JP;
Abstract
A method of inspecting a defect on a surface of a printed matter includes a step of applying a gray scale erosion filter to a non-defect surface of a printed matter to prepare a gray scale erosion filter applied image and then adding a predetermined density value to the gray scale erosion filter applied image, thereby preparing a reference image, a step of subtracting a captured image of the surface of the printed matter to be inspected from the reference image, thereby preparing a differential image, and a step of applying a density compensation process to the differential image to prepare a density compensated image, then applying an edge detection filter to the density compensated image to prepare an edge detection filter applied image and then converting the edge detection filter applied image into binary data according to a predetermined threshold value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile