The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Aug. 25, 2003
Robert Howard, Raytown, MO (US);
Jack Johnson, Harrisonville, MO (US);
David Hoover, San Luis Obispo, CA (US);
Robert Howard, Raytown, MO (US);
Jack Johnson, Harrisonville, MO (US);
David Hoover, San Luis Obispo, CA (US);
Sprint Communications Company L.P., Overland Park, KS (US);
Abstract
A test system and method for scheduling and running multiple tests on a single system residing in a single test environment. The test system comprises a processor operable to receive a request to run a selected test on the system at a selected start time, and determine a time slot for the selected test. The test system is also operable to identify any scheduled tests to be run on the system within the time slot, and identify any conflicts between the selected test and any scheduled tests. If no scheduled tests are identified or if no conflicts are identified, the processor is operable to schedule the selected test to run on the system at the selected start time. If conflicts are identified, the processor is preferably operable to determine an alternative start time for the selected test that avoids any conflicts. Various exemplary embodiments of the test system and associated method are provided.