The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Feb. 25, 2003
Kyoichiro Wakayama, Yokohama, JP;
Hiroya Koshishiba, Chigasaki, JP;
Hidehiro Okada, Tokyo, JP;
Yukiya Hattori, Hitachi, JP;
Kyoichiro Wakayama, Yokohama, JP;
Hiroya Koshishiba, Chigasaki, JP;
Hidehiro Okada, Tokyo, JP;
Yukiya Hattori, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Engineering & Services Co., Ltd., Ibaraki, JP;
Abstract
An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.