The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2007

Filed:

Nov. 01, 2004
Applicant:

Gaétan Duplain, Beauport, CA;

Inventor:

Gaétan Duplain, Beauport, CA;

Assignee:

Opsens Inc., Québec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method and a system for measuring a physical quantity by means of a tandem interferometer optical sensor system based on low-coherence interferometry. The system comprises a light system, a sensing interferometer and a polarization readout interferometer. The invention provides a polarization interferometer comprising a single birefringent wedge. The invention also provides for a dispersion-compensated optical sensor system. The invention also provides an interferometer sensitive to temperature that comprises a trajectory in a LBOcrystal with an x-cut orientation.


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