The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2007

Filed:

Jun. 02, 2004
Applicants:

Koichi Ono, Saitama, JP;

Teruo Fujii, Tokyo, JP;

Serge Camou, Tokyo, JP;

Inventors:

Koichi Ono, Saitama, JP;

Teruo Fujii, Tokyo, JP;

Serge Camou, Tokyo, JP;

Assignee:

Enplas Corporation, Saitama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an optical systemfor a micro analyzing system capable of precisely analyzing a sample. In the optical system, after light beams leaving the tip of an optical fiberpass through a condensing part, a sample moving in a separation passagedue to electrophoresis is irradiated with the light beams. The condensing partincludes a first aspherically cylindrical surfacebeing convex toward the optical fiber, a second aspherically cylindrical surfacebeing convex on the opposite side to the first aspherically cylindrical surface, and a third aspherically cylindrical surfacebeing convex toward the second aspherically cylindrical surface. The first through third aspherically cylindrical surfacesthroughare arranged in that order from the side of the optical fibertoward the separation passage. The sample moving due to electrophoresis is irradiated with light beams which are condensed by the first through third aspherically cylindrical surfacesthroughafter leaving the optical fiber


Find Patent Forward Citations

Ono, Koichi. (2007). Optical system for micro analyzing system (U.S. Patent No. 7259849). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7259849

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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